Document Type
Patent
Publication Date
5-25-2010
Patent Number
patent number 7724005
Abstract
Disclosed is an apparatus and methodology for characterization of small devices. On-chip subtraction of parasitic effects including coupling capacitive effects is provided by way of a rat-race employing a pair of gaps. A device or material being tested is positioned in a test position gap and an output signal is extracted from the rat-race at a position displaced along the rat-race between the test position gap and the other gap to provide subtractive cancellation of any parasitic effects associated with the rat-race and especially associated with the test position gap.
Application Number
12/179047
Assignees
Clemson University
Filing Date
2008-07-24
Primary/U.S. Class
324/754.28
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