Document Type
Poster
Publication Date
Spring 2015
Abstract
An Atomic Force Microscope (AFM) is an important tool in modern nanoscience. The AFM is capable of producing surface maps at resolutions below 1 nm, which is impossible for other methods. The goal of this project is to create a macro scale model, which will serve as an educational tool to introduce the principles behind AFM to undergraduate and high school students. Currently a fully automatic microprocessor-controlled surface scanning block has been built and successfully tested with a scan area of one square foot. Continued work includes designing and building of a topography measurement block that will work on the same principle as a real AFM does at nano-level. We expect that macro AFM building an image using AFM techniques will empower instructors to show the concepts, and to spark interest of potential students in Bioengineering. Sponsors for this project have been the Creative Inquiry Program and the Bioengineering Department.
Recommended Citation
Bagnal, Nolan; Dauter, Cale; Evans, Clay; Hoelzen, Max; Portilla, Margarita; Schleicher, Michelle; and Reukov, Vladimir, "An Educational Model of Atomic Force Microscope" (2015). Focus on Creative Inquiry. 138.
https://tigerprints.clemson.edu/foci/138
Comments
Poster presentation at Clemson University 10th Annual Focus on Creative Inquiry Forum, Clemson, SC.